90
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abberior instruments
instruments expert line sted system Instruments Expert Line Sted System, supplied by abberior instruments, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more https://www.bioz.com/product/image+cross-correlation+spectroscopy/instruments+expert+line+sted+system/pm40334261-186-14-12 Average 90 stars, based on 1 article reviews
instruments expert line sted system - by Bioz Stars,
2026-09
90/100 stars
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86
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10X Genomics
visium spatial gene expression array Visium Spatial Gene Expression Array, supplied by 10X Genomics, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more https://www.bioz.com/product/image+cross-correlation+spectroscopy/expression+gene+slides+spatial+visium/pmc12077394-423-140-146 Average 86 stars, based on 1 article reviews
visium spatial gene expression array - by Bioz Stars,
2026-09
86/100 stars
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90
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Optics and Photonics
laser systems Laser Systems, supplied by Optics and Photonics, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more https://www.bioz.com/product/image+cross-correlation+spectroscopy/laser+systems/pm35635002-26-82-77 Average 90 stars, based on 1 article reviews
laser systems - by Bioz Stars,
2026-09
90/100 stars
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98
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Gatan Inc
imaging filter quantum post column energy filter Imaging Filter Quantum Post Column Energy Filter, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 98/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more https://www.bioz.com/product/image+cross-correlation+spectroscopy/GIF+Continuum+and+Continuum+S/pmc06220290-190-38-37 Average 98 stars, based on 1 article reviews
imaging filter quantum post column energy filter - by Bioz Stars,
2026-09
98/100 stars
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97
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JEOL
jeol 2200fs aberration Jeol 2200fs Aberration, supplied by JEOL, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more https://www.bioz.com/product/image+cross-correlation+spectroscopy/JEM-2200FS+Transmission+Electron+Microscope/10__1063_slash_1__4928855-71-6-6 Average 97 stars, based on 1 article reviews
jeol 2200fs aberration - by Bioz Stars,
2026-09
97/100 stars
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99
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Hitachi Ltd
hf5000 Hf5000, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more https://www.bioz.com/product/image+cross-correlation+spectroscopy/HF5000/custom%40hf5000%4027125910 Average 99 stars, based on 1 article reviews
hf5000 - by Bioz Stars,
2026-09
99/100 stars
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99
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Hitachi Ltd
su8600 Su8600, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more https://www.bioz.com/product/image+cross-correlation+spectroscopy/SU8600/custom%40su8600%4010%2E1016%2Fj%2Ejoule%2E2020%2E05%2E011 Average 99 stars, based on 1 article reviews
su8600 - by Bioz Stars,
2026-09
99/100 stars
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99
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Olympus
fv3000 laser scanning microscope Fv3000 Laser Scanning Microscope, supplied by Olympus, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more https://www.bioz.com/product/image+cross-correlation+spectroscopy/FV3000+Confocal+Laser+Scanning+Microscope/bio_rxiv__2025__06__28__662102-430-21-20 Average 99 stars, based on 1 article reviews
fv3000 laser scanning microscope - by Bioz Stars,
2026-09
99/100 stars
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96
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JEOL
jeol arm200f microscope operating Jeol Arm200f Microscope Operating, supplied by JEOL, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more https://www.bioz.com/product/image+cross-correlation+spectroscopy/JEM-ARM200F_NEOARM+Transmission+Electron+Microscope/arxiv__2501__19304-120-32-32 Average 96 stars, based on 1 article reviews
jeol arm200f microscope operating - by Bioz Stars,
2026-09
96/100 stars
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99
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JEOL
2100 f 200 kv field emission analytical transmission electron microscope 2100 F 200 Kv Field Emission Analytical Transmission Electron Microscope, supplied by JEOL, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more https://www.bioz.com/product/image+cross-correlation+spectroscopy/JEM-2100F+Transmission+Electron+Microscope/pmc11525546-238-48-47 Average 99 stars, based on 1 article reviews
2100 f 200 kv field emission analytical transmission electron microscope - by Bioz Stars,
2026-09
99/100 stars
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90
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Wodtke GmbH
surface femtosecond two-photon photoemission spectrometer Surface Femtosecond Two Photon Photoemission Spectrometer, supplied by Wodtke GmbH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more https://www.bioz.com/product/image+cross-correlation+spectroscopy/surface+femtosecond+two+photon+photoemission+spectrometer/pm39568364__jp4c07061_si_001-244-103-99 Average 90 stars, based on 1 article reviews
surface femtosecond two-photon photoemission spectrometer - by Bioz Stars,
2026-09
90/100 stars
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90
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Schmid GmbH
reduce charging effects on beam sensitive material by optimized scanning routines in sem Reduce Charging Effects On Beam Sensitive Material By Optimized Scanning Routines In Sem, supplied by Schmid GmbH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more https://www.bioz.com/product/image+cross-correlation+spectroscopy/reduce+charging+effects+on+beam+sensitive+material+by+optimized+scanning+routines+in+sem/10__1017_slash_s1431927619000722-59-268-286 Average 90 stars, based on 1 article reviews
reduce charging effects on beam sensitive material by optimized scanning routines in sem - by Bioz Stars,
2026-09
90/100 stars
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